Simultaneous High Sensitivity Trace-Element and Isotopic Analysis of Gemstones Using Laser Ablation Inductively Coupled Plasma Time-of-Flight Mass Spectrometry. Published in Journal of Gemmology, 2016, 35, 3, 212-223. Author(s): H.A.O. Wang, M.S. Krzemnicki, J.-P. Chalain, P. Lefevre, W. Zhou, L.E. Cartier

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The Swiss Gemmological Institute SSEF has become the first gem laboratory worldwide to introduce into its facility the ground-breaking GemTOF instrument, which conducts chemical analysis through laser ablation, thereby providing more information about the origin of a variety of gems, as well as precisely identi