Simultaneous High Sensitivity Trace-Element and Isotopic Analysis of Gemstones Using Laser Ablation Inductively Coupled Plasma Time-of-Flight Mass Spectrometry
Simultaneous High Sensitivity Trace-Element and Isotopic Analysis of Gemstones Using Laser Ablation Inductively Coupled Plasma Time-of-Flight Mass Spectrometry. Published in Journal of Gemmology, 2016, 35, 3, 212-223.
Author(s): H.A.O. Wang, M.S. Krzemnicki, J.-P. Chalain, P. Lefevre, W. Zhou, L.E. Cartier
